Detection of outliers with a Bayesian hierarchical model: application to the single-grain luminescence dating method.

Authors

  • Jean-Michel Galharret University of Nantes
  • Anne Philippe Nantes Universit ́e, CNRS, Laboratoire de Math ́ematiques Jean Leray, LMJL, F-44000 Nantes
  • Norbert Mercier Centre de Recherche en Physique Appliqu ́ee `a l’Arch ́eologie, Universit ́e Bordeaux Montaigne (IRAMAT-CRP2A- UMR 5060), F-33600 Pessac

DOI:

https://doi.org/10.1285/i20705948v14n2p318

Keywords:

application to luminescence dating method, event hierarchical model, outliers

Abstract

The event model was proposed by Lanos and Philippe (2018) to combine measurements in the context of archaeological chronological dating. We extend this model to luminescence dating and define a new strategy to detect outliers from the hyperparameters of the event model. This procedure is applied to the combination of Gaussian measurements and luminescence age estimation. We illustrate through simulations that it is preferable, in terms of accuracy and precision, to exclude detected outliers rather than use the robust estimation method (e.g. the event model).

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Published

20-11-2021